Translation: from english

Scanning ion-conductance microscopy

Look at other dictionaries:

  • Scanning ion-conductance microscopy — The scanning ion conductance microscope (SICM) consists of an electrically charged glass micro or nanopipette probe filled with electrolyte lowered toward the surface of the sample (which is non conducting for ions) in an oppositely charged bath… …   Wikipedia

  • Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

  • Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

  • Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia

  • Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …   Wikipedia

  • Magnetic resonance force microscopy — (MRFM) is an imaging technique that acquires magnetic resonance images (MRI) at nanometer scales, and possibly at atomic scales in the future. MRFM is potentially able to observe protein structures which cannot be seen using X ray crystallography …   Wikipedia

  • Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… …   Wikipedia

  • Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… …   Wikipedia

  • List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy …   Wikipedia

  • Microscope — This article is about microscopes in general. For light microscopes, see optical microscope. Microscope Us …   Wikipedia

  • Optical microscope — Microscope Uses Small sample observation Notable experiments Discovery of cells Inventor Hans Lippershey Zacharias Jans …   Wikipedia

Share the article and excerpts

Direct link
Do a right-click on the link above
and select “Copy Link”

Wir verwenden Cookies für die beste Präsentation unserer Website. Wenn Sie diese Website weiterhin nutzen, stimmen Sie dem zu.